High-speed semiconductor production test & high-speed functional test
Detailed signal analysis (signal curve, pulse width, in-circuit measurements)
Test scenarios with several measuring points in different ranges (AC and DC)
•4 Instruments in 1 device:
16 Bit high precision Digital Multimeter
16 Bit isolated Digitizer
•Changing range in under 1 ms
•Up to 2 Trigger I/Os on the device front (8 on the backplane)
•2- and 4-wire resistance measurement
•Measure up to 500 Vpp and 1 A
>1 GΩ || <20 pF input impedance •Available with PXI or PXI Express interface •Fully isolated design
Complex test scenarios require increasingly simple solutions while reducing the overall costs. The innovative “Multi-Measurement Device” (MMD) architecture of VX Instruments combines four different functionalities on a compact plug-in module (1 PXI slot) and thus expands the application possibilities of a classic digital multimeter:
•Oscilloscopes / digitizers
The extremely short configuration times of the measuring mode and measuring range significantly reduce the test time. This is particularly important when it comes to fully automated test environments.
With the integrated digitizer functionality, signal curves of up to 10 MS/s can be recorded at a constant 16 Bit resolution. The often common degradation of the resolution at high sample rates, therefore, does not need to be taken into account.
Electronic protection devices on the module increase the robustness of the device and thus the availability when used in an industrial environment.
Please see manual